The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Oct. 26, 2012
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Sumito Nakano, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); A62B 1/04 (2006.01); A61B 1/00 (2006.01); G02B 23/24 (2006.01); G02B 23/26 (2006.01); G01D 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 1/00009 (2013.01); A61B 1/00057 (2013.01);
Abstract

An imaging section images a subject to generate an image. A display displays an image. A measuring section measures the size of the subject on the basis of the image. A recording section associates calibration data of a measuring endoscope apparatus including a value obtained when the measuring section measures the size of the calibrator on the basis of an image obtained when the imaging section has imaged the calibrator, and calibration data of the calibrator including a value obtained when the calibrator is measured by a higher-rank measuring instrument of a traceability system, and a value obtained when the measuring section measures the size of a measurement object different from the calibrator on the basis of an image of the measurement object, with the image of the measurement object image and records the associated data on a recording medium.


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