The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Apr. 18, 2013
Applicant:

Microsoft Corporation, Redmond, WA (US);

Inventors:

Zhiwei Xiong, Beijing, CN;

Feng Wu, Beijing, CN;

Zhe Yang, Liaoning, CN;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 7/00 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0271 (2013.01); G01B 11/2513 (2013.01); G06T 7/0057 (2013.01); G06T 7/0065 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10152 (2013.01);
Abstract

A method, system, and one or more computer-readable storage media for depth acquisition from density modulated binary patterns are provided herein. The method includes capturing a number of images for a scene using an IR camera and a number of IR lasers including diffraction grates. Each image includes a density modulated binary pattern carrying phase information. The method also includes performing pixel based phase matching for the images to determine depth data for the scene based on the phase information carried by the density modulated binary patterns.


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