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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9294758 B1

PDFFull Text
Date of Patent:
Mar. 22, 2016

Filed:

Apr. 18, 2013

Determining depth data for a captured image

Applicant:

Microsoft Corporation, Redmond, WA (US);

Inventors:

Zhiwei Xiong, Beijing, CN;

Feng Wu, Beijing, CN;

Zhe Yang, Liaoning, CN;

Assignee:

Microsoft Technology Licensing, LLC, Redmond, WA (US);

Attorneys:

Sandy Swain

Micky Minhas

Primary Examiner:

Jefferey Harold

Assistant Examiner:

Sean Haiem

Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 7/00 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0271 (2013.01); G01B 11/2513 (2013.01); G06T 7/0057 (2013.01); G06T 7/0065 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10152 (2013.01);
Abstract

A method, system, and one or more computer-readable storage media for depth acquisition from density modulated binary patterns are provided herein. The method includes capturing a number of images for a scene using an IR camera and a number of IR lasers including diffraction grates. Each image includes a density modulated binary pattern carrying phase information. The method also includes performing pixel based phase matching for the images to determine depth data for the scene based on the phase information carried by the density modulated binary patterns.

Find Patent Forward Citations

Xiong, Zhiwei. (2016). Determining depth data for a captured image (U.S. Patent No. 9294758). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9294758

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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