The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Apr. 10, 2013
Applicants:

Calvin Wan, Plano, TX (US);

Kumaravel Senthivel, Murphy, TX (US);

Inventors:

Calvin Wan, Plano, TX (US);

Kumaravel Senthivel, Murphy, TX (US);

Assignee:

Fujitsu Limited, Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/0835 (2013.01);
Abstract

A method and system for performing synthetic loss measurements (SLM) includes methods for single-ended and dual-ended synthetic loss measurements. The methods include maintaining a session number indicative of a physical network component at each maintenance point used to perform synthetic loss measurements. The session numbers are maintained according to a novel protocol and are used to detect a change in the network component, such as resulting from a protection switch event. The session numbers enable the synthetic loss measurements to continue irrespective of changes in the values for the session numbers and to remove errors when computing frame loss that may arise when physical network components change. The disclosed methods and systems may be used when a link aggregation group exists between a local maintenance point and a remote maintenance point.


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