The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Jul. 05, 2012
Soheil Feizi-khankandi, Cambridge, MA (US);
Vivek K. Goyal, Cambridge, MA (US);
Muriel Médard, Belmont, MA (US);
Soheil Feizi-Khankandi, Cambridge, MA (US);
Vivek K. Goyal, Cambridge, MA (US);
Muriel Médard, Belmont, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
Described herein is a sampling system and related sampling scheme. The system and sampling scheme is based upon a framework for adaptive non-uniform sampling schemes. In the system and schemes described herein, time intervals between samples can be computed by using a function of previously taken samples. Therefore, keeping sampling times (time-stamps), except initialization times, is not necessary. One aim of this sampling framework is to provide a balance between reconstruction distortion and average sampling rate. The function by which sampling time intervals can be computed is called the sampling function. The sampling scheme described herein can be applied appropriately on different signal models such as deterministic or stochastic, and continuous or discrete signals. For each different signal model, sampling functions can be derived.