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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9294034 B1

PDFFull Text
Date of Patent:
Mar. 22, 2016

Filed:

Nov. 21, 2014

Measurement device for texture size, manufacturing system for solar cell, and manufacturing method for solar cell

Applicant:

Sanyo Electric Co., Ltd., Moriguchi-shi, Osaka, JP;

Inventor:

Hirotada Inoue, Hyogo, JP;

Assignee:

PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD, , JP;

Attorney:

Cantor Colburn LLP

Primary Examiner:

Michael Lebentritt

Int. Cl.
CPC ...
H01L 31/18 (2006.01); H02S 50/15 (2014.01); G01B 11/02 (2006.01); G01N 21/84 (2006.01); G01N 21/59 (2006.01); H01L 31/0236 (2006.01); H01L 31/0747 (2012.01); B05B 12/00 (2006.01); G01B 11/30 (2006.01); H01L 31/0224 (2006.01); G01N 21/3563 (2014.01);
U.S. Cl.
CPC ...
H02S 50/15 (2014.12); B05B 12/004 (2013.01); G01B 11/02 (2013.01); G01B 11/303 (2013.01); G01N 21/59 (2013.01); G01N 21/84 (2013.01); H01L 31/02363 (2013.01); H01L 31/022425 (2013.01); H01L 31/0747 (2013.01); G01N 2021/3568 (2013.01); Y02E 10/50 (2013.01);
Abstract

A manufacturing method for a solar cell, wherein after a texture is formed on a principal surface of a substrate, infrared light in a predetermined wave number range is applied to a portion, on which the texture is formed, of the principal surface, a wave number at a specified transmission detection rate of the infrared light transmitted through the substrate and detected is acquired, the Tx size of the substrate is calculated on the basis of the acquired wave number using a previously obtained relationship between the wave number at the specified transmission detection rate and the Tx size, and when the calculated Tx size is within a reference value range, a collecting electrode is formed on the principal surface.

Find Patent Forward Citations

Inoue, Hirotada. (2016). Measurement device for texture size, manufacturing system for solar cell, and manufacturing method for solar cell (U.S. Patent No. 9294034). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9294034

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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