The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
May. 22, 2014
Applicant:
Semiconductor Energy Laboratory Co., Ltd., Kanagawa-ken, JP;
Inventors:
Toshimitsu Konuma, Kanagawa, JP;
Junya Maruyama, Kanagawa, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/08 (2006.01); H01L 27/32 (2006.01); H01L 27/12 (2006.01); H01L 51/00 (2006.01); H01L 29/786 (2006.01); H01L 51/52 (2006.01);
U.S. Cl.
CPC ...
H01L 27/3258 (2013.01); H01L 27/12 (2013.01); H01L 27/1248 (2013.01); H01L 27/3246 (2013.01); H01L 27/3248 (2013.01); H01L 51/0001 (2013.01); H01L 27/3281 (2013.01); H01L 29/78621 (2013.01); H01L 29/78627 (2013.01); H01L 29/78645 (2013.01); H01L 51/005 (2013.01); H01L 51/0034 (2013.01); H01L 51/0035 (2013.01); H01L 51/0038 (2013.01); H01L 51/0042 (2013.01); H01L 51/0062 (2013.01); H01L 51/0084 (2013.01); H01L 51/0085 (2013.01); H01L 51/524 (2013.01); H01L 51/5237 (2013.01); H01L 2251/5392 (2013.01); H01L 2251/558 (2013.01);
Abstract
Failure light emission of an EL element due to failure film formation of an organic EL material in an electrode holeis improved. By forming the organic EL material after embedding an insulator in an electrode holeon a pixel electrode and forming a protective portion, failure film formation in the electrode holecan be prevented. This can prevent concentration of electric current due to a short circuit between a cathode and an anode of the EL element, and can prevent failure light emission of an EL layer.