The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Sep. 02, 2014
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Sung-Jin Whang, Gyeonggi-do, KR;

Moon-Sig Joo, Gyeonggi-do, KR;

Kwon Hong, Gyeonggi-do, KR;

Jung-Yeon Lim, Gyeonggi-do, KR;

Won-Kyu Kim, Gyeonggi-do, KR;

Bo-Min Seo, Gyeonggi-do, KR;

Kyoung-Eun Chang, Gyeonggi-do, KR;

Assignee:

SK Hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/285 (2006.01); H01L 21/28 (2006.01); H01L 21/321 (2006.01); H01L 23/00 (2006.01); H01L 27/108 (2006.01); H01L 29/423 (2006.01); H01L 29/51 (2006.01); H01L 29/788 (2006.01); H01L 29/41 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 21/28518 (2013.01); H01L 21/28273 (2013.01); H01L 21/28282 (2013.01); H01L 21/321 (2013.01); H01L 21/7685 (2013.01); H01L 24/02 (2013.01); H01L 27/10873 (2013.01); H01L 29/413 (2013.01); H01L 29/42324 (2013.01); H01L 29/513 (2013.01); H01L 29/7881 (2013.01); H01L 2224/0401 (2013.01); H01L 2924/0105 (2013.01); H01L 2924/01005 (2013.01); H01L 2924/01006 (2013.01); H01L 2924/01014 (2013.01); H01L 2924/01022 (2013.01); H01L 2924/01027 (2013.01); H01L 2924/01033 (2013.01); H01L 2924/01073 (2013.01); H01L 2924/04941 (2013.01); H01L 2924/12032 (2013.01);
Abstract

A semiconductor device including a conductive layer, a diffusion barrier layer formed over the conductive layer, including a refractory metal compound, and acquired after a surface treatment, and a metal silicide layer formed over the diffusion barrier layer. The adhesion between a diffusion barrier layer and a metal silicide layer may be improved by increasing the surface energy of the diffusion barrier layer through a surface treatment. Therefore, although the metal silicide layer is fused in a high-temperature process, it is possible to prevent a void from being caused at the interface between the diffusion barrier layer and the metal silicide layer. Moreover, it is possible to increase the adhesion between a conductive layer and the diffusion barrier layer by increasing the surface energy of the conductive layer through the surface treatment.


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