The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Jun. 05, 2014
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Hiroe Minagawa, Fujisawa, JP;

Noboru Ooike, Yokohama, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 16/26 (2006.01); G11C 11/56 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G11C 11/5642 (2013.01); G11C 16/0483 (2013.01); G11C 2029/0411 (2013.01);
Abstract

A nonvolatile semiconductor memory device according to one embodiment includes a control circuit. The control circuit is configured to apply, when reading data of a first selected memory cell provided in a ROM area, a first read voltage to a first selected word line, and apply a first read pass voltage lower than a second read pass voltage to a first non-selected word line, thus allowing for the ROM area reading operation of reading a threshold voltage set in the first selected memory cell. The control circuit is configured to apply, when reading data of a second selected memory cell provided in a normal storage area, a second read voltage to a second selected word line, and apply the second read pass voltage to a second non-selected word line, thus allowing for a normal storage area reading operation of reading a threshold voltage set in the second selected memory cell.


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