The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Apr. 18, 2013
Applicants:

Jae-goo Lee, Hwaseong-si, KR;

Jin-soo Lim, Hwaseong-si, KR;

Inventors:

Jae-Goo Lee, Hwaseong-si, KR;

Jin-Soo Lim, Hwaseong-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Suwon-Si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); G11C 5/06 (2006.01); H01L 21/48 (2006.01); H01L 27/115 (2006.01); H01L 21/768 (2006.01); H01L 23/485 (2006.01); G11C 8/14 (2006.01); H01L 23/522 (2006.01);
U.S. Cl.
CPC ...
G11C 5/063 (2013.01); G11C 8/14 (2013.01); H01L 21/486 (2013.01); H01L 21/76816 (2013.01); H01L 23/485 (2013.01); H01L 27/11573 (2013.01); H01L 27/11575 (2013.01); H01L 23/5226 (2013.01); H01L 27/11582 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A vertical type semiconductor device includes a pillar structure protruding from a top surface of a substrate of a cell array region. Word lines extend while surrounding the pillar structure. Word line contacts contact edges of the word lines functioning as pad portions. An insulating interlayer pattern is provided on the substrate of a peripheral circuit region, which is disposed at an outer peripheral portion of the cell array region. A first contact plug contacts the substrate of the peripheral circuit region. A second contact plug contacts a top surface of the first contact plug and has a top surface aligned on the same plane with the top surfaces of the word line contacts. The first and second contact plugs are stacked in the peripheral circuit region, so the failure of the vertical type semiconductor device is reduced.


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