The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Jul. 01, 2014
Iteris, Inc., Santa Ana, CA (US);
Jaimyoung Kwon, Berkeley, CA (US);
Karl F. Petty, Berkeley, CA (US);
Alex A. Kurzhanskiy, Albany, CA (US);
Andrew J. Moylan, Berkeley, CA (US);
ITERIS, INC., Santa Ana, CA (US);
Abstract
Quality assessment of probe data collected from GPS systems is performed by a system and method of determining a value of data points provided by different vendors of such data. Incoming raw probe data is initially analyzed for removal of extraneous data points, and is then mapped to roadway links and smoothed out. The resulting output is processed to determine the coverage value of data provided by a given vendor and enable a comparison between different vendors. Such a model of probe data processing also enables an evaluation of a contribution of further vendors of raw probe data to an existing dataset. Additionally, a real-time performance evaluation of continually-ingested probe data includes building historical and data count profiles, and generating output data represented by a number of data points for a specific distance within a geo-box representing a geographical area, to project a value of raw probe data for a next incremental time period.