The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Jun. 29, 2012
Applicants:

Kazuhiro Watanabe, Tokyo, JP;

Wataru Kaku, Yokohama, JP;

Hiroyuki Fukushima, Mitaka, JP;

Kaori Miyake, Yokohama, JP;

Inventors:

Kazuhiro Watanabe, Tokyo, JP;

Wataru Kaku, Yokohama, JP;

Hiroyuki Fukushima, Mitaka, JP;

Kaori Miyake, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/40 (2006.01);
U.S. Cl.
CPC ...
G06T 11/40 (2013.01);
Abstract

To generate a high-quality mosaic image even in a case where a material image having a shape different from that of a region in which the material image is to be placed is used. A target image is divided into a plurality of different-sized regions. The size of a material image is changed in accordance with the area of corresponding one of the regions, and is placed in the region on the basis of the chromatic component of the region. In the case of overlapping material images that have been placed, control processing is performed so that a smaller one of them is placed on a larger one of them.


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