The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Nov. 29, 2012
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Hiroshi Kitajima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0085 (2013.01); G06T 7/0044 (2013.01); G06T 7/0097 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/30108 (2013.01); Y10S 901/47 (2013.01);
Abstract

A three-dimensional measurement method three-dimensionally restores an edge having a cross angle close to parallel to an epipolar line. Edges e, eand eon the same plane of a work are selected, and among these edges, at least two edges eand eresiding in a predetermined angle range with reference to the cross angle of 90° crossing the epipolar line are three-dimensionally restored by a stereo method. Then, a three-dimensional plane Pincluding these three-dimensionally restored eand eis found, and the edge eresiding beyond a predetermined angle range with reference to the cross angle of 90° crossing the epipolar line is projected to this three-dimensional plane P, thus three-dimensionally restoring the edge e.


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