The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Jan. 31, 2014
Applicant:

Pictometry International Corp., Rochester, NY (US);

Inventors:

Stephen L. Schultz, West Henrietta, NY (US);

David R. Nilosek, Rochester, NY (US);

David S. Petterson, Avon, NY (US);

Timothy S. Harrington, Rochester, NY (US);

Assignee:

Pictometry International Corp., Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06T 7/00 (2006.01); G06T 7/60 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 7/0042 (2013.01); G06T 7/606 (2013.01); G06T 2207/10044 (2013.01); G06T 2207/30184 (2013.01);
Abstract

An image display and analysis system is disclosed. The image display and analysis system and method includes a system for reading an image having an object of interest. The image includes corresponding location data indicative of position and orientation of the image capturing device(s) used to capture the image. The system receives one or more selected points within the image on the object of interest, and calculates a measurement of the object of interest using pixel location, the position and orientation of the image capturing device(s), and a TGP vertical plane.


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