The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Mar. 31, 2012
Applicants:

Derek Lin, San Mateo, CA (US);

Yael Villa, Tel Aviv, IL;

Alon Kaufman, Bnei-Dror, IL;

Inventors:

Derek Lin, San Mateo, CA (US);

Yael Villa, Tel Aviv, IL;

Alon Kaufman, Bnei-Dror, IL;

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 7/005 (2013.01);
Abstract

A method is used in analyzing device similarity. Data describing a device is received and a model is applied to the data. Based on the modeling, a measure of similarity between the device and a previously known device is determined.


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