The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Sep. 14, 2012
Applicants:

Jeannine Dussi, Arlington, MA (US);

Edward Ganshirt, Lexington, MA (US);

Ray Goodwin, Shrewsbury, MA (US);

Stan Liffman, Newbury, MA (US);

Tony Mao, Natick, MA (US);

Doug Moe, Manchester, NH (US);

Steve Rettew, Harvard, MA (US);

Ian Smith, Scottsdale, AZ (US);

Charlene Soley, Westford, MA (US);

Le Nguyen, Dorchester, MA (US);

Qian Sun, Westford, MA (US);

Will Whelan, Arlington, MA (US);

Diana Zipeto, Lowell, MA (US);

Gregg Sweetser, Nashua, NH (US);

Inventors:

Jeannine Dussi, Arlington, MA (US);

Edward Ganshirt, Lexington, MA (US);

Ray Goodwin, Shrewsbury, MA (US);

Stan Liffman, Newbury, MA (US);

Tony Mao, Natick, MA (US);

Doug Moe, Manchester, NH (US);

Steve Rettew, Harvard, MA (US);

Ian Smith, Scottsdale, AZ (US);

Charlene Soley, Westford, MA (US);

Le Nguyen, Dorchester, MA (US);

Qian Sun, Westford, MA (US);

Will Whelan, Arlington, MA (US);

Diana Zipeto, Lowell, MA (US);

Gregg Sweetser, Nashua, NH (US);

Assignee:

Medica Corporation, Bedford, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G06K 19/07 (2006.01); G01N 35/02 (2006.01); G01N 35/10 (2006.01); G06F 3/0481 (2013.01);
U.S. Cl.
CPC ...
G06K 19/0723 (2013.01); G01N 35/00722 (2013.01); G01N 35/025 (2013.01); G01N 35/10 (2013.01); G06F 3/04817 (2013.01); G01N 2035/00326 (2013.01); Y10T 436/11 (2015.01); Y10T 436/114165 (2015.01);
Abstract

An automated chemistry analysis method is disclosed. In one general aspect, the method includes receiving a modular chemistry analysis test unit that includes one or more vessels for one or more reagents, and a machine-readable test specification coupled with the vessels. The method also includes defining a test that defines a test including a series of operations that employ the reagents for the vessels, and installing the chemistry analysis test unit in a first chemistry analyzer that includes one or more analysis tools and sequencing logic for sequencing instructions to be carried out by the analysis tools. The machine-readable test specification is automatically received from the chemistry analysis test module and stored for access by the sequencing logic to allow the sequencing logic to instruct the analysis tools to carry out the test defined by the test specification.


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