The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Dec. 21, 2012
Hitachi, Ltd., Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
Provided is a region extraction system that uses an image data analysis process, which has overcome the problem of false positives in region extraction and assists in more accurate region extraction. A luminance distribution-analyzing unit () is used to determine a parameter of unknown quantity for extracting a region of interest. The luminance distribution-analyzing unit () searches a luminance distribution management database () for a region, which has a luminance distribution similar to the region of interest and is easily extracted, as a similar area. The region of the similar area is extracted using a region extraction pre-processing unit () and the value of the parameter of unknown quantity is determined on the basis of an image feature value calculated from the region extraction results.