The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Sep. 23, 2013
Applicants:

Harish Tyagi, Cupertino, CA (US);

Xiaojun Feng, Palo Alto, CA (US);

Inventors:

Harish Tyagi, Cupertino, CA (US);

Xiaojun Feng, Palo Alto, CA (US);

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30994 (2013.01);
Abstract

Systems and methods for determining alternative visual analytics are described. Visual analytics result from the application of visual analytic patterns that include instructions for generating visualizations of analytical data. Analytical data is the result of the execution of analytical operations specified in a report definition on an underlying business object. By analyzing the metadata associated with the report definition or visual analytic pattern, alternative visual analytic patterns may be determined that better represent the character of the analytical data. The metadata may include a mapping that associates alternative visual analytic patterns with a business object, a report definition, or another visual analytic pattern. Accordingly, the determination of the alternative visual analytic patterns may be based on the mappings. The alternative visual analytic pattern s may then be applied to the analytic data to generate one or more alternative visual analytics that may be selected by a user.


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