The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Dec. 03, 2014
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Junichi Sakagami, Tokyo, JP;

Kenji Tanaka, Tokyo, JP;

Seiji Wada, Kanagawa, JP;

Kenji Yamane, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/16 (2006.01); G02B 21/36 (2006.01); G01N 21/64 (2006.01); G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
G02B 21/361 (2013.01); G01J 3/4406 (2013.01); G01N 21/6458 (2013.01); G02B 21/16 (2013.01); G01N 2021/6419 (2013.01); G01N 2021/6441 (2013.01); G01N 2201/1053 (2013.01);
Abstract

There is provided an image acquisition device including a light source configured to emit laser light and to be capable of controlling a wavelength of the laser light, a measurement unit configured to scan a sample using the laser light and to measure an intensity of measurement target light from the sample by receiving the laser light, and a control unit configured to generate an image of the sample based on intensity distribution of the measured measurement target light. The control unit controls a wavelength of the laser light based on the intensity distribution of the measured measurement target light.


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