The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Apr. 01, 2011
Applicants:

Kazuhiko Momoki, Koshigaya, JP;

Hirokatsu Miyata, Hadano, JP;

Masahiko Takahashi, Hachioji, JP;

Daisuke Sano, Utsunomiya, JP;

Inventors:

Kazuhiko Momoki, Koshigaya, JP;

Hirokatsu Miyata, Hadano, JP;

Masahiko Takahashi, Hachioji, JP;

Daisuke Sano, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 1/10 (2015.01); G02B 1/118 (2015.01);
U.S. Cl.
CPC ...
G02B 1/118 (2013.01);
Abstract

The anti-reflection structure includes a graded refractive index layer that is disposed on a substrate and whose refractive index decreases as a distance from the substrate increases, and a homogeneous layer that is disposed on the graded refractive index layer and whose refractive index is homogeneous. The structure satisfies a condition of nb−na>0.10 where na represents the refractive index of the homogenous layer, and nb represents a homogenous layer side effective refractive index of the graded index refractive index layer.


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