The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
May. 31, 2012
Walter Sollner, Oslo, NO;
Norman Daniel Whitmore, Jr., Houston, TX (US);
Stian Hegna, Lysaker, NO;
Charles Lameloise, Lysaker, NO;
Rune Tonnessen, Oslo, NO;
Gregg Parkes, Weybridge, GB;
Walter Sollner, Oslo, NO;
Norman Daniel Whitmore, Jr., Houston, TX (US);
Stian Hegna, Lysaker, NO;
Charles Lameloise, Lysaker, NO;
Rune Tonnessen, Oslo, NO;
Gregg Parkes, Weybridge, GB;
PGS GEOPHYSICAL AS, Oslo, NO;
Abstract
Systems and methods for imaging subterranean formations using primary and multiple reflections are described. An exploration-seismology vessel tows a seismic source, a receiver acquisition surface located beneath a free surface, and a source acquisition surface positioned at a depth below the source. The receiver acquisition surface is used to measure pressure and normal velocity wavefields and the source acquisition surface is used to measure direct, down-going, source pressure wavefields generated by the source. The down-going source pressure wavefields in combination with the down-going pressure wavefields and up-going pressure wavefields computed from the pressure and velocity wavefields are used to compute images of the subterranean formation associated with primary reflections and multiple reflections.