The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Jul. 20, 2012
Applicants:
David Le Meur, Gif-sur-Yvette, FR;
Katia Garceran, Saint Cheron, FR;
Inventors:
David Le Meur, Gif-sur-Yvette, FR;
Katia Garceran, Saint Cheron, FR;
Assignee:
CGGVERITAS SERVICES SA, Massy Cedex, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/36 (2006.01); G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/366 (2013.01); G01V 1/307 (2013.01);
Abstract
Methods and systems for a surface-consistent amplitude and deconvolution simultaneous joined inversion are described. A one-pass estimation using input trace data for generating gain and deconvolution operator based on a least squares iteration method. A series of iterations are performed simultaneously and independently estimating amplitude scalars and autocorrelation spectra with a common convergence criterion. The gain and deconvolution operator can further be used to correct the input trace data for pre-stack or stack imaging.