The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Apr. 24, 2012
Applicants:

Eduard Batkilin, Nesher, IL;

Irina Karelin, Haifa, IL;

Alex Feldman, Nofit, IL;

Inventors:

Eduard Batkilin, Nesher, IL;

Irina Karelin, Haifa, IL;

Alex Feldman, Nofit, IL;

Assignee:

GENERIC IMAGING LTD., Nesher, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 7/00 (2006.01); G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
G01T 7/005 (2013.01); G01T 1/2018 (2013.01);
Abstract

System and method for correcting geometric distortion in a multi-camera flat panel X-Ray detector. A scintillator converts X-Ray radiation generated by an X-Ray source into detectable radiation. Internal markers are placed at known locations adjacent to the scintillator, inside a casing of the detector. External markers placed at known locations outside the casing, adjacent to a cover of the detector. At least one imaging sensor acquires, during the calibration phase, a partial image depicting the external markers and the internal markers. The location of the external markers and the internal markers on the partial X-Ray image is found. A parallax free transformation for correcting geometric distortion based on differences between relation between physical location of the external markers and location of the external markers on the X-Ray image and relation between physical location of the internal markers and location of internal markers on the partial X-Ray image is calculated.


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