The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Aug. 28, 2014
Jin-myoung Lee, Gumi-si, KR;
Il-kwon Lee, Hwaseong-si, KR;
Jun-woo Lee, Gwacheon-si, KR;
Sang-goo Jung, Daegu, KR;
Kyoung-mi Park, Yongin-si, KR;
In-ae Lee, Seoul, KR;
Jin-Myoung Lee, Gumi-si, KR;
Il-Kwon Lee, Hwaseong-si, KR;
Jun-Woo Lee, Gwacheon-si, KR;
Sang-Goo Jung, Daegu, KR;
Kyoung-Mi Park, Yongin-si, KR;
In-Ae Lee, Seoul, KR;
SAMSUNG ELECTRONICS CO., LTD., Gyeonggi-Do, KR;
Abstract
A semiconductor device, a test structure of the semiconductor device, and a method of testing the semiconductor device are provided. The test structure including a first pad and a second pad being separated from each other, and a first test element and a second test element connected between the first pad and the second pad, a first value of a characteristic parameter of the first test element being different from a second value of the characteristic parameter of the second test element, may be provided.