The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Dec. 19, 2013
Applicant:
Ford Global Technologies, Llc, Dearborn, MI (US);
Inventor:
James Paul Ebling, Ann Arbor, MI (US);
Assignee:
Ford Global Technologies, LLC, Dearborn, MI (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); H01Q 3/26 (2006.01); G01S 7/40 (2006.01); G01S 13/04 (2006.01); G01S 5/02 (2010.01); H01Q 1/32 (2006.01); G01S 13/34 (2006.01); G01S 13/93 (2006.01); G01S 7/35 (2006.01); G01S 13/58 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); G01S 7/40 (2013.01); G01S 7/4026 (2013.01); G01S 13/04 (2013.01); G01S 13/343 (2013.01); G01S 13/931 (2013.01); H01Q 1/3233 (2013.01); H01Q 3/267 (2013.01); G01S 13/584 (2013.01); G01S 2007/356 (2013.01); G01S 2007/4039 (2013.01);
Abstract
A system includes an antenna having a substrate and a plurality of antenna elements disposed on the substrate. A processing device is configured to measure an aperture function across an aperture of the antenna and determine whether at least one of the antenna elements is blocked based at least in part on the measured aperture function.