The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Jul. 29, 2015
Applicant:

Industry-academic Cooperation Foundation Yonsei University, Seoul, KR;

Inventors:

Shinill Kang, Seoul, KR;

Jungjin Han, Seoul, KR;

Eikhyun Cho, Seoul, KR;

Jongmyeong Shim, Seoul, KR;

Wonjoon Choi, Seoul, KR;

Se-Young Choi, Goyang-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/22 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/22 (2013.01);
Abstract

A near field optical imaging device includes: a light source for radiating light of a far field optical system; and an optical head including thin film layer for formation of dynamic optical nano apertures, combined with a measured object in one piece to generate a near field by a beam radiated from the light source, in which the measured object can be scanned in a depth direction by adjusting a depth of the near field, and the depth of the near field is adjusted by modifying a shape of an opening of the thin film layer for formation of dynamic optical nano apertures by adjusting an amount of the light radiated from the light source.


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