The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Jun. 15, 2011
Method for measurement of vibration property of structure, and vibration property measurement device
Applicants:
Itsuro Kajiwara, Hokkaido, JP;
Naoki Hosoya, Saitama, JP;
Inventors:
Itsuro Kajiwara, Hokkaido, JP;
Naoki Hosoya, Saitama, JP;
Assignees:
NATIONAL UNIVERSITY CORPORATION HOKKAIDO UNIVERSITY, Sapporo-Shi, Hokkaido, JP;
SHIBAURA INSTITUTE OF TECHNOLOGY, Tokyo, JP;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01F 17/00 (2006.01); G01N 29/36 (2006.01); G01M 5/00 (2006.01); G01M 7/00 (2006.01);
U.S. Cl.
CPC ...
G01N 29/36 (2013.01); G01M 5/0066 (2013.01); G01M 5/0075 (2013.01); G01M 5/0091 (2013.01); G01M 7/00 (2013.01);
Abstract
A method for generating vibration and measuring vibration properties of a structure, such as information equipment, micro-electrco/mechanical systems, and large-equipment, using a non-contact type laser excitation in a non-contact type vibration property measurement system.