The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Aug. 15, 2012
Applicants:

Toshiyuki Suzuma, Tokyo, JP;

Yoshiyuki Nakao, Tokyo, JP;

Makoto Sakamoto, Tokyo, JP;

Yoshiyuki Oota, Tokyo, JP;

Inventors:

Toshiyuki Suzuma, Tokyo, JP;

Yoshiyuki Nakao, Tokyo, JP;

Makoto Sakamoto, Tokyo, JP;

Yoshiyuki Oota, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01N 27/83 (2006.01); G01N 27/90 (2006.01);
U.S. Cl.
CPC ...
G01N 27/82 (2013.01); G01N 27/83 (2013.01); G01N 27/902 (2013.01);
Abstract

A magnetic testing apparatusaccording to the present invention comprises: a first magnetizing devicefor applying a DC bias magnetic field to a test object P in substantially parallel to the direction in which a flaw F to be detected extends; a second magnetizing devicefor applying an AC magnetic field to the test object P substantially perpendicularly to the direction in which the flaw F to be detected extends; and a detecting devicefor detecting leakage flux produced by the magnetization of the test object P accomplished by the first magnetizing deviceand the second magnetizing device


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