The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Nov. 22, 2013
Cilag Gmbh International, Zug, CH;
David Elder, Inverness, GB;
Steven Setford, Inverness, GB;
Allan Faulkner, Inverness, GB;
Ryan Walsh, Inverness, GB;
Cilag GmbH International, Zug, CH;
Abstract
An analytical test strip can include a patterned definition layer defining two fluidically-separated sample cells having respective ports, a common electrode arranged over the definition layer and in electrical communication with each of the cells, and respective cell electrodes. Surface portions of each electrode can be exposed. A method for testing a fluid sample using such a strip includes receiving a first fluid sample in the first sample cell and detecting a first electrical property thereof. It is then determined whether a second fluid sample should be added to the other sample cell. An analyte measurement system can include such a strip and test meter to receive the strip. The test meter can detect respective electrical properties of fluid samples in the cells.