The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Mar. 31, 2014
Eastman Kodak Company, Rochester, NY (US);
Todd Mathew Spath, Hilton, NY (US);
Gary Alan Kneezel, Webster, NY (US);
EASTMAN KODAK COMPANY, Rochester, NY (US);
Abstract
A method for forming a second pattern in registration with a first pattern on a substrate is disclosed. The method comprises providing the substrate having a first magnitude of an associated electrical characteristic and at least one alignment structure that is associated with a second magnitude of the electrical characteristic different from the first magnitude. A controller is used to control an electrical probe to measure the electrical characteristic at a plurality of positions proximate the substrate. The measured electrical characteristic corresponds to the alignment structure when the probe is proximate to the alignment structure and to the substrate when the probe is not proximate to the alignment structure. The measured electrical characteristics are used to identify a location of the alignment structure. The second pattern is formed so that it is in registration with the first pattern, based on the identified location of the alignment structure.