The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Nov. 04, 2013
Applicant:

Sumitomo Rubber Industries, Ltd., Kobe-shi, Hyogo, JP;

Inventors:

Ryo Mashita, Kobe, JP;

Hiroyuki Kishimoto, Kobe, JP;

Tomomi Masui, Kobe, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/201 (2006.01); G01N 23/202 (2006.01);
U.S. Cl.
CPC ...
G01N 23/202 (2013.01); G01N 23/201 (2013.01); G01N 2223/1006 (2013.01); G01N 2223/106 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/623 (2013.01);
Abstract

The present invention provides a method for evaluating energy loss in a polymeric material, wherein the method provides sufficient evaluation of the difference in performance between samples with excellent measurement accuracy; a method for evaluating chipping resistance of a polymeric material, wherein the method provides evaluation in a short period of time and at low cost with excellent measurement accuracy; and a method for evaluating abrasion resistance of a polymeric material, wherein the method provides sufficient evaluation of the difference in performance between samples with excellent measurement accuracy. The present invention relates to methods for evaluating energy loss, chipping resistance, and abrasion resistance of a polymeric material, and the methods include irradiating the polymeric material with X-rays or neutrons to perform X-ray scattering measurement or neutron scattering measurement.


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