The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Apr. 05, 2013
Applicant:

Datacolor Holding Ag, Lucerne, CH;

Inventors:

Zhiling Xu, West Windsor, NJ (US);

Michael H. Brill, Kingston, NJ (US);

Assignee:

Datacolor Holding AG, Lucerne, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01N 21/645 (2013.01); G01N 21/276 (2013.01);
Abstract

Aligning measurements of fluorescent spectral radiance factors taken by a first instrument with measurements of fluorescent spectral radiance factors taken by a second instrument, without knowledge of the matrix of bispectral luminescent radiance factor of any sample, includes obtaining a fluorescent spectral radiance factor of a reference sample, measured by the first instrument, obtaining the fluorescent spectral radiance factor of the reference sample, measured by the second instrument, obtaining a fluorescent spectral radiance factor of a test sample, measured by the first instrument, and estimating the fluorescent spectral radiance factor of the test sample that would be measured by the second instrument, based on the fluorescent spectral radiance factor of a reference sample, measured by the first instrument, on the fluorescent spectral radiance factor of the reference sample, measured by the second instrument, and on the fluorescent spectral radiance factor of the test sample, measured by the first instrument.


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