The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Mar. 22, 2013
Mitsui Engineering & Shipbuilding Co., Ltd., Chuo-ku, Tokyo, JP;
National University Corporation Hokkaido University, Sapporo-shi, Hokkaido, JP;
Shigeyuki Nakada, Tamano, JP;
Yusuke Ohba, Sapporo, JP;
Kyouji Doi, Tamano, JP;
Yumi Asano, Tamano, JP;
MITSUI ENGINEERING & SHIPBUILDING, Tokyo, JP;
NATIONAL UNIVERSITY CORPORATION HOKKAIDO UNIVERSITY, Hokkaido, JP;
Abstract
FRET measurement uses a FRET probe that includes a probe element X containing a donor fluorescent substance and a probe element Y containing an acceptor fluorescent substance and enables FRET to occur when the probe element X and the probe element Y approach to each other or bind together. The modulation frequency of laser light with which the FRET probe is irradiated is adjusted to an optimum modulation frequency that maximizes a difference between the phase difference of donor fluorescence emitted from the donor fluorescent substance with respect to intensity modulation of the laser light at the time when FRET occurs and the phase difference of donor fluorescence emitted from the donor fluorescent substance with respect to intensity modulation of the laser light at the time when FRET does not occur.