The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Apr. 20, 2012
Takao Nakagawa, Tokyo, JP;
Koji Masutani, Tokyo, JP;
Tetsuya Sugimoto, Tokyo, JP;
S.T. Japan, Inc., Tokyo, JP;
Abstract
An objective optical system for ATR measurement is provided with a housing, in the interior, an ATR crystal that is transparent in visible light and has a semispherical surface through which light enters; an infrared optical member for irradiating a sample with infrared light at an angle that is equal to or greater than the critical angle; a visible light irradiation optical member which is disposed in the interior of the casing and which irradiates the sample with visible light from an angle less than the critical angle; and an observation optical member which is disposed on a position that is offset from the reflection angle relative to the angle at which the visible light enters the sample and which guides the scattering light from the sample to an observation device. As a consequence, it is possible to clearly observe the position of a sample subjected to ATR measurement.