The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Nov. 01, 2013
Sakura Finetek Japan Co., Ltd., Tokyo, JP;
Tatsuya Miyatani, Tokyo, JP;
SAKURA FINETEK JAPAN CO., LTD., Tokyo, JP;
Abstract
An automatic thin section sample preparation device includes: a reading portion which reads the ID data; a first imaging portion which images a surface image of an embedding block; a sample preparation mechanism which prepares a thin section by thinly cutting the embedding block, fixes the thin section to a substrate, and prepares a thin section sample; a second imaging portion which images a thin section image of the thin section in the thin section sample; a recording portion which records individual data on the substrate in the thin section sample; and a control portion. The control portion includes a determination portion which determines whether or not the thin section is prepared from an original embedding block by collating the surface image and the thin section image, and a storage portion which stores the determination result from the determination portion in association with the ID data, as the individual data.