The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Mar. 13, 2014
Sandia Corporation, Albuquerque, NM (US);
Grant Biedermann, Albuquerque, NM (US);
Hayden James Evans McGuinness, Albuquerque, NM (US);
Akash Rakholia, Albuquerque, NC (US);
Yuan-Yu Jau, Albuquerque, NM (US);
Peter Schwindt, Albuquerque, NM (US);
David R. Wheeler, Albuquerque, NM (US);
Sandia Corporation, Albuquerque, NM (US);
Abstract
An atomic interferometric device useful, e.g., for measuring acceleration or rotation is provided. The device comprises at least one vapor cell containing a Raman-active chemical species, an optical system, and at least one detector. The optical system is conformed to implement a Raman pulse interferometer in which Raman transitions are stimulated in a warm vapor of the Raman-active chemical species. The detector is conformed to detect changes in the populations of different internal states of atoms that have been irradiated by the optical system.