The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Dec. 07, 2012
Applicants:

Brooks A. Childers, Christiansburg, VA (US);

Roger Glen Duncan, Christiansburg, VA (US);

Ajit Balagopal, Christiansburg, VA (US);

Dan R. Provenzano, Blacksburg, VA (US);

Inventors:

Brooks A. Childers, Christiansburg, VA (US);

Roger Glen Duncan, Christiansburg, VA (US);

Ajit Balagopal, Christiansburg, VA (US);

Dan R. Provenzano, Blacksburg, VA (US);

Assignee:

BAKER HUGHES INCORPORATED, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01J 4/00 (2006.01); G01N 21/954 (2006.01); G01D 5/353 (2006.01);
U.S. Cl.
CPC ...
G01J 4/00 (2013.01); G01D 5/35316 (2013.01); G01D 5/35393 (2013.01); G01N 21/954 (2013.01);
Abstract

A system and method to obtain and process interferometer output scans is described. The interferometer-based sensor system includes a tunable laser to transmit a transmit signal and a polarization scrambler to produce a polarization state change on the transmit signal. The system also includes an interferometer to provide an output scan based on the transmit signal with the polarization state change and a processor to process the output scan.


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