The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Jan. 10, 2013
Karlsruher Institut Für Technologie, Karlsruhe, DE;
Simon Schneider, Welzheim, DE;
Christian Koos, Siegelsbach, DE;
Wolfgang Freude, Karlsruhe, DE;
Juerg Leuthold, Walzbachtal, DE;
KARLSRUHER INSTITUT FÜR TECHNOLOGIE, Karlsruhe, DE;
Abstract
The invention lies in the field of optical metrology and related to optical coherence tomography (OCT). In particular, the invention relates to an apparatus and a method for the depth-dependent adaptation of the dynamic range of an OCT system to the profile of the backscattered power to be measured. The dynamic range of the measuring method can therefore be decoupled from the dynamic range of the analog/digital converter used. The invention is used, in particular, in the characterization of strongly scattering or strongly absorbing biological or technical samples.