The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Jul. 01, 2014
Applicant:

Osram Gmbh, Munich, DE;

Inventors:

Joerg Sorg, Regensburg, DE;

Florian Boesl, Regensburg, DE;

Dennis Sprenger, Roethenbach a.d. Pegnitz, DE;

Assignee:

OSRAM GmbH, Munich, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F21V 9/16 (2006.01); F21V 7/04 (2006.01); G01S 1/00 (2006.01); G09B 9/00 (2006.01); H01S 3/00 (2006.01); H01S 3/30 (2006.01); F21K 99/00 (2010.01); F21S 8/10 (2006.01); G02B 6/00 (2006.01); G03B 21/20 (2006.01); A61B 1/06 (2006.01); A61B 1/07 (2006.01); A61B 1/05 (2006.01); F21Y 101/02 (2006.01);
U.S. Cl.
CPC ...
F21K 9/56 (2013.01); A61B 1/0653 (2013.01); A61B 1/07 (2013.01); F21K 9/52 (2013.01); F21S 48/1145 (2013.01); F21S 48/1225 (2013.01); F21S 48/214 (2013.01); F21V 9/16 (2013.01); G02B 6/00 (2013.01); G03B 21/204 (2013.01); G03B 21/208 (2013.01); A61B 1/05 (2013.01); F21Y 2101/025 (2013.01);
Abstract

In various embodiments, a lighting device includes at least one laser light source and a light wavelength conversion element. The light wavelength conversion element includes phosphor which is arranged on a surface region of a substrate and is used for wavelength conversion of the light emitted by the at least one laser light source. The light wavelength conversion element has a greater thickness at the edge of the surface region, provided with phosphor, of the substrate than at the surface centroid of the surface region, provided with phosphor, of the substrate. The thickness is respectively measured perpendicularly to the surface region, provided with phosphor, of the substrate.


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