The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Nov. 19, 2010
Applicants:

John A. Leogrande, West Hartford, CT (US);

Peter L. Jalbert, Granby, CT (US);

Inventors:

John A. Leogrande, West Hartford, CT (US);

Peter L. Jalbert, Granby, CT (US);

Assignee:

UNITED TECHNOLOGIES CORPORATION, Hartford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F01D 25/00 (2006.01); F01D 11/02 (2006.01); F01D 17/02 (2006.01); F01D 17/20 (2006.01); F01D 21/00 (2006.01);
U.S. Cl.
CPC ...
F01D 11/025 (2013.01); F01D 17/02 (2013.01); F01D 17/20 (2013.01); F01D 21/003 (2013.01); F05D 2250/30 (2013.01); Y10T 29/4932 (2015.01);
Abstract

An apparatus includes a blade clearance detection system. A probe is configured to communication detection frequencies from and gather reflected signals for the blade tip detection system. The probe has an end supported relative to the casing. A material provides a reference point. The blade tip clearance detection system is configured to generate a first detection frequency configured to pass through the material to detect the position of a target structure, generate a second detection frequency configured to reflect from and detect the reference point, and determine a position of a surface approximate to the target structure based upon the reference point.


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