The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Jun. 28, 2011
DO Gyoon Kim, Yongin-si, KR;
Han Sang Kim, Osan-si, KR;
Yang Ui Lee, Seoul, KR;
Yoon Kyoung Cho, Suwon-si, KR;
NA Hui Kim, Suwon-si, KR;
Sang Bum Park, Hwaseong-si, KR;
Do Gyoon Kim, Yongin-si, KR;
Han Sang Kim, Osan-si, KR;
Yang Ui Lee, Seoul, KR;
Yoon Kyoung Cho, Suwon-si, KR;
Na Hui Kim, Suwon-si, KR;
Sang Bum Park, Hwaseong-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A microfluidic device having a delay structure and a sample testing apparatus including the microfluidic device are provided. The microfluidic device includes: a reaction chamber which contains a reagent capable of reacting with a sample; a distribution channel through which the sample is provided to the reaction chamber; an inlet channel through which the at least one reaction chamber is connected with the distribution channel; and a delay structure which is located between the at least one reaction chamber and the distribution channel, and delays movement of contents of the reaction chamber to the distribution channel.