The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Nov. 24, 2010
Applicant:

Joan Bruna Estrach, Paris, FR;

Inventor:

Joan Bruna Estrach, Paris, FR;

Assignee:

ZORAN (FRANCE) S.A., Neuilly-Sur-Seine, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 21/4402 (2011.01); H04N 5/14 (2006.01); H04N 7/01 (2006.01);
U.S. Cl.
CPC ...
H04N 21/440281 (2013.01); H04N 5/145 (2013.01); H04N 7/012 (2013.01); H04N 7/0115 (2013.01);
Abstract

A method is proposed for analyzing an interlaced video signal including a first sequence of fields. A temporal regularity estimation process is applied to the first sequence of fields to compute a first metric. Inputs of the temporal regularity estimation process include pixel values from at least two fields having respective ranks differing by more than one in the sequence. The same temporal regularity estimation process is applied to second and third sequences of fields to compute second and third metrics. The second sequence is derived from the first sequence by swapping fields having ranks of the form 2k and 2k+1 for any integer k, while the third sequence is derived from the first sequence by swapping fields having ranks of the form 2k−1 and 2k. The first, second and third metrics are compared in a determination of the time arrangement of the fields in the first sequence.


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