The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Oct. 08, 2010
Applicants:

Youngkyung Park, Seoul, KR;

Hyounghwa Yoon, Seoul, KR;

Jaeshin Yu, Uiwang, KR;

Sungjin Kim, Anyang, KR;

Inventors:

Youngkyung Park, Seoul, KR;

Hyounghwa Yoon, Seoul, KR;

Jaeshin Yu, Uiwang, KR;

Sungjin Kim, Anyang, KR;

Assignee:

LG ELECTRONICS INC., Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06K 9/00 (2006.01); G08B 13/19 (2006.01); G08B 13/196 (2006.01);
U.S. Cl.
CPC ...
H04N 7/18 (2013.01); G06K 9/00771 (2013.01); G08B 13/19615 (2013.01); G08B 13/19669 (2013.01); G08B 13/19671 (2013.01); G08B 13/19682 (2013.01);
Abstract

Disclosed are an image monitoring device capable of detecting a meaningful event on the basis of a scenario by providing a function of setting various combinations of monitoring events in a monitored image in which a plurality of monitoring events are set, and an event detecting method thereof. The event detecting method of an image monitoring device includes: obtaining a monitored image; detecting an occurrence of a first monitoring event with respect to an object from the obtained monitored image; detecting an occurrence of a second monitoring event with respect to the object from the obtained monitored image; and storing information regarding the detected occurrence of the second monitoring event.


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