The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Oct. 31, 2012
Applicant:

Samsung Display Co., Ltd., Gyeonggi-Do, KR;

Inventors:

June-Woo Lee, Gyeonggi-Do, KR;

Jae-Beom Choi, Gyeonggi-Do, KR;

Kwan-Wook Jung, Gyeonggi-Do, KR;

Sung-Soo Choi, Gyeonggi-Do, KR;

Seong-Jun Kim, Gyeonggi-Do, KR;

Guang-Hai Jin, Gyeonggi-Do, KR;

Ga-Young Kim, Gyeonggi-Do, KR;

Jee-Hoon Kim, Gyeonggi-Do, KR;

Assignee:

Samsung Display Co., Ltd., Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/12 (2006.01); G01R 31/02 (2006.01); H01L 27/32 (2006.01);
U.S. Cl.
CPC ...
H01L 27/124 (2013.01); G01R 31/025 (2013.01); H01L 27/3276 (2013.01); H01L 2251/568 (2013.01);
Abstract

A display apparatus is disclosed. The apparatus includes a plurality of unit pixels each comprising a plurality of sub pixels, a plurality of scan wires, and a plurality of scan lines branching off from each of the scan wires and extending in a first direction. The number of scan lines from each scan wire equals the number of sub pixels for each pixel, and each scan line connects one of the scan wires with one of the sub pixels of each of a plurality of unit pixels. The apparatus also includes a plurality of data lines extending in a second direction orthogonal to the first direction and which are connected to the plurality of sub pixels. The apparatus also includes a first power supply line extending in the second direction and connected to the sub pixels, and a plurality of test pads, each connected to the scan lines of one of the scan wires.


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