The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Sep. 30, 2009
Harukazu Miyamoto, Higashimurayama, JP;
Koichi Watanabe, Hachioji, JP;
Yutaka Nagai, Yokohama, JP;
Koichiro Nishimura, Yokohama, JP;
Takakiyo Yasukawa, Fujisawa, JP;
Harukazu Miyamoto, Higashimurayama, JP;
Koichi Watanabe, Hachioji, JP;
Yutaka Nagai, Yokohama, JP;
Koichiro Nishimura, Yokohama, JP;
Takakiyo Yasukawa, Fujisawa, JP;
HITACHI CONSUMER ELECTRONICS CO., LTD., Tokyo, JP;
Abstract
A method for performing recording on a multilayered optical disk which has three or more recordable or rewritable information recording layers with a first recording layer and a second recording layer located nearer to a light incident surface than the first recording layer, and which respectively has a first test area configured by a plurality of segments in the first recording layer and in the second recording layer, wherein a predetermined radial distance L is defined beforehand. When an arbitrary segment in the second test area is test-recorded, a segment in the first test area, the radial distance of which from the recorded test area in the second test area is within the range of the predetermined radial distance L, is set as a segment in which test recording is not performed.