The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Aug. 25, 2014
Applicants:

Ravi Panchumarthy, Tampa, FL (US);

Dinuka K. Karunaratne, Tampa, FL (US);

Sudeep Sarkar, Tampa, FL (US);

Sanjukta Bhanja, Tampa, FL (US);

Inventors:

Ravi Panchumarthy, Tampa, FL (US);

Dinuka K. Karunaratne, Tampa, FL (US);

Sudeep Sarkar, Tampa, FL (US);

Sanjukta Bhanja, Tampa, FL (US);

Assignee:

University of South Florida, Tampa, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01); G06T 7/00 (2006.01); G01Q 60/24 (2010.01); G01Q 60/50 (2010.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0081 (2013.01); G01Q 60/24 (2013.01); G01Q 60/50 (2013.01); G06K 9/6217 (2013.01); G06T 2207/20112 (2013.01);
Abstract

A system and method for image-processing that will facilitate automatically analyzing and estimating atomic force microscopy (AFM) images and magnetic force microscopy (MFM) images of fabricated nanomagnetic arrays to identify the magnetization states of the nanomagnets in the array. The system and method will automatically estimate the magnetization states of nanomagnetics disks into one of a plurality of energy minimum magnetization state configurations and provide an annotated image of the results of the estimation.


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