The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Mar. 12, 2014
Thales Visionix, Inc., Clarksburg, MD (US);
Robert B. Atac, Batavia, IL (US);
Mark W. Edel, Downers Grove, IL (US);
Scott A. Spink, Aurora, IL (US);
Mark S. Fischler, Warrenville, IL (US);
William R. Null, Channahon, IL (US);
THALES VISIONIX, INC., Clarksburg, MD (US);
Abstract
Aspects of the present invention relate to systems, methods, and computer program products for measuring and compensating for optical distortion. The system includes a plurality of reference marks; a recording device configured to record a first orientation and a first position of a plurality of reference marks relative to a pointing angle of the recording device when an object is located outside of a field of view of a recording device, the recording device configured to record a second orientation and a second position of a plurality of reference marks relative to the pointing angle of the recording device when an object is located inside the field of view; and a processor configured to compare the first orientation and the first position of the plurality of reference marks to the second orientation and the second position of the plurality of the reference marks for measuring distortion of the object.