The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Jan. 23, 2014
Nidek Co., Ltd., Gamagori, Aichi, JP;
Ai Yamakawa, Aichi, JP;
Hisanori Torii, Aichi, JP;
Norimasa Satake, Aichi, JP;
Tetsuya Kano, Aichi, JP;
Kenshiro Fujiu, Aichi, JP;
NIDEK CO., LTD., Aichi, JP;
Abstract
There is provided an ophthalmic analysis apparatus configured to acquire an analysis result of a tomographic image of a subject eye which is acquired by using optical coherence tomography (OCT), and to output the analysis result. The apparatus functions as a display control unit configured to control a display unit to display a two-dimensional image based on an OCT tomographic image; an analysis region setting unit configured to set multiple analysis regions on the two-dimensional image displayed on the display unit by the display control unit; and an output control unit configured to acquire an analysis result in the multiple analysis regions set by the analysis region setting unit and to output the acquired analysis result.