The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Jul. 25, 2013
Applicant:

Mariappan S. Nadar, Plainsboro, NJ (US);

Inventors:

Alban Lefebvre, Jersey City, NJ (US);

Axel Loewe, Monmouth Junction, NJ (US);

Mariappan S. Nadar, Plainsboro, NJ (US);

Jun Liu, Plainsboro, NJ (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/54 (2006.01); G06T 1/20 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G06T 1/20 (2013.01); G01R 33/5608 (2013.01);
Abstract

A computer-implemented method for calculating a multi-dimensional wavelet transform in an image processing system comprising a plurality of computation units includes receiving multi-dimensional image data. An overlap value corresponding to a number of non-zero filter coefficients associated with the multi-dimensional wavelet transform is identified. Then the multi-dimensional image data is divided into a plurality of multi-dimensional arrays, wherein the multi-dimensional arrays overlap in each dimension by a number of pixels equal to the overlap value. A multi-dimensional wavelet transform is calculated for each multi-dimensional array, in parallel, across the plurality of computation units.


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