The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Jun. 26, 2012
Simon Duchesne, Quebec, CA;
Fernando Valdivia, Quebec, CA;
Burt Crépault, Quebec, CA;
UNIVERSITÉ LAVAL, Quebec, CA;
Abstract
Applicants have discovered a multi-layer quality control/quality assurance system that provides higher quality data, without human intervention, by rejecting images that do not achieve a pre-determined quality threshold. In some embodiments of the present invention, there is provided a new method of processing an image from a data set through a pipeline wherein quality control/assurance allows to determine a quality of the image processing, the method comprising; receiving a test image; pre-processing the test image; registering the test image to a reference image; calculating a test image quality using a correlation of image intensity values between corresponding locations of the test image and the reference image; providing a plurality of training images and calculating training image quality distribution statistics for the training images with respect to the reference image; and relating the test image quality to the training image quality distribution.