The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Oct. 23, 2014
Applicant:
Hrl Laboratories, Llc, Malibu, CA (US);
Inventors:
Hai-Wen Chen, Aberdeen, MD (US);
Yuri Owechko, Newbury Park, CA (US);
Assignee:
HRL Laboratories, LLC, Malibu, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06T 11/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4604 (2013.01); G06T 7/0083 (2013.01); G06T 7/0091 (2013.01); G06T 11/003 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20036 (2013.01);
Abstract
Described is a system for adaptive three-dimensional (3D) to two-dimensional (2D) projection for different height slices and extraction of morphological features. Initially, the system receives 3D point cloud data. Next, an image pixel number to point cloud number ratio is selected. Thereafter, an image row and image column are selected to identify desired height slices. The 3D point cloud is then accumulated on the desired height slices to generate a plurality of 2D height slices.